LTX-Credence ships 600th PAx test system for RF front-end devices

Aug. 22, 2017

Norwood, MA. LTX-Credence announced that it has shipped the 600th PAx test system, with the latest system going to Skyworks Solutions Inc., a maker of high-performance analog semiconductors. The PAx platform has been specifically designed to address the high-volume manufacturing test challenges of suppliers of advanced front-end RF devices such as multiband RF power amplifiers, RF front-end modules, RF and analog system-in-package (SiP) devices, and RF discrete devices. The PAx platform is shipped in two main configurations—PAx and PAx-ac—which are deployed at most IDM, fabless, and OSAT companies specializing in the high volume manufacturing and test of these types of devices, LTX-Credence reports.

“Our goal with the PAx platform was to offer semiconductor manufacturers of RF front-end devices an alternative to deploying their own in house test systems,” said Steve Wigley, vice president of the semiconductor tester group of Xcerra, LTX-Credence’s parent company. “Our approach was to leverage LTX-Credence RF manufacturing test technology and use our systems expertise to package it in a compact footprint to offer the required levels of performance, fast test times, and operational availability. The shipment of the 600th of these test systems demonstrates the value of this approach and has established the PAx platform as the clear market leader for testing RF front-end applications with an estimated market share greater than 70%.”

http://ltxc.com/pax-ac

See related article “Xcerra’s diminutive DxV debuts in San Francisco.”

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.