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WEBCAST: How To Get The Most From Your Low-Current Measurement Instruments

March 19, 2010
If you're not sure that you're getting the best results from low-current measurements, this seminar is for you. Keithley's John Tucker takes you through the basics of low-current measurements, best practices for ensuring success, and application examples.

This seminar describes the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.

By participating in this seminar, you will learn and understand:

  • Measurement techniques required for measuring very small currents
  • Sources of measurement error that will affect such low current measurements
  • Measurement solutions that can be used in low current measurement applications

Presenter: John Tucker is the Senior Marketer for Keithley’s Scientific Research Instruments and Research and Education business at Keithley Instruments in Cleveland, Ohio.

Watch WEBCAST now.

Keithley Instruments

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.

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