Test & Measurement
Keeping track of what you’ve got
March 20, 2017
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So many ways to stick layers together
March 20, 2017
Test & Measurement
Modal math may not add up
Feb. 22, 2017
Tom Lecklider
Tom joined EE as Senior Technical Editor in 1998, writing feature articles and special reports on a wide range of topics stemming from extensive USA and UK instrumentation design and marketing experience. Tom earned an MSEE degree from New York University and a BSEE from Case Institute of Technology and holds several display and control-related patents.