A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations.
Accurate ripple and noise measurements on power rails require a high-bandwidth oscilloscope and a dedicated probe to perform low-noise measurements and provide the offset capability to zoom in on top of the DC voltage. The R&S®RT-ZPR20 power rail probe as well as the R&S®RTE and the R&S®RTO digital oscilloscopes are excellent tools for this measurements.
