Wp 108062 Image 1540x800 5f3bf31e96f87

Increase LVS verification productivity in early design cycles

Aug. 20, 2020
Target short isolation analysis and debugging on incomplete/immature blocks, macros, and chips.

Introducing Calibre nmLVS-Recon, which gives designers a systematic methodology for prioritizing and resolving high-impact circuit issues in early design stages. Learn more about the short isolation use model, with three built-in options for analyzing specific areas:

  • Targeted short isolation analysis and debugging on incomplete/immature blocks, macros, and chips during early design phases
  • Fast iterations of short isolation analysis and debugging, speeding up overall time to tapeout
  • Partition designs by layer type, layer groups, or net type to support error prioritization

Sponsored

This video explores TE Connectivity’s HIVONEX High-Power Charging Inlets for fast and secure quick charging of up to 500 A at 1,000 VDC. Designed for industrial and commercial...
This article examines the motor-monitoring challenge. It then presents a practical example of edge AI performing this function using analog, digital, and mixed-signal ICs from...
The STMicroelectronics STM32N6, based on the Arm® Cortex®-M55, integrates advanced features like the ST Neural-ART Accelerator for power-efficient edge AI, and an enhanced computer...
Explore Raspberry Pi’s imaging and AI tools in this free webinar with expert insights from Naushir Patuck. Register now to attend live or watch the recording later.