June 26, 2014. Koh Young Technology and Koh Young America will effectively enter the semiconductor market with the unveiling of HORUS, Koh Young’s new 3D measurement system, at SEMICON West July 8-10 in San Francisco.
Koh Young’s HORUS, named after the ancient Egyptian god, can measure the volume and dimension of virtually any type of substance, part, component, or die. HORUS can also precisely measure transparent and shiny materials with high speed and accuracy.
HORUS will help customers realize higher yields in semiconductor and advanced packaging applications by measuring objects that have been considered difficult to measure with appreciable speed, without sacrificing accuracy. HORUS’ primary advantage over current systems is that HORUS can measure virtually any object and is particularly capable of precisely measuring transparent ones at production speeds, the companies, say, adding that HORUS is the first machine with this capability to enter the market.
HORUS is suitable for semiconductor applications as well as a range of electronics manufacturing and assembly applications, including board-level SMT. HORUS can measure shiny objects including flux and solder balls using its very wide field of view (FOV) optics. The combination of wide FOV and quick inspection speed allows HORUS to be used as an in-line inspection machine. This will also facilitate lot testing on all products, rather than traditional sampling inspection due to slow inspection speeds.
In addition to the new HORUS, Koh Young will demonstrate its other patented full 3D measurement-based inspection solutions for AOI applications. Koh Young's patented technology enables inspection based on the 3D profilometric shape of semiconductor components in flip chip packaging at in-line speed.
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