McBain Debuts Benchtop Infrared Inspection System

March 19, 2012. McBain Systems, a provider of microscopes and inspection equipment, has introduced the BT-IR Benchtop Infrared Microscope System for interior, infrared (IR) inspection applications in semiconductor and other advanced technology industries. The new system allows an operator to see through materials that are transparent in the infrared range between 740 nm and 1700 nm.

The BT-IR yields submicron-precision optical measurements, and its staging provides up to 0.1-micron linear encoder resolution. In addition, the system features a high-resolution 900-1700 InGaAs digital camera.

“The new BT-IR System fills an important market niche,” said Michael Crump, president and CEO of McBain Systems. “It is a manual system with a smaller footprint and lower price, yet it is designed to provide much of the power and flexibility of our higher end inspection systems. And users can start with the BT-IR and later scale up to one of our larger, more automated IR inspection systems, such as the DDR-300NIR or DDR-2000SWIR, as their needs grow.”

The McBain BT-IR system features a motorized XY stage with joystick controls to navigate, observe, and measure bonded wafer/die alignments, find defects in a manual mode, and determine material stress via the system's optional birefringence capability. The system is suited for imaging, verification, inspection, and metrology for a range of QA/reliability and R&D applications. Typical in-process applications include verification of pre-bond and pre-hybridization for critical-alignment applications.

Post-process uses include validation, inspection, and measurement of critical sub-surface features in NIR/SWIR-transmissible materials. And failure analysis applications include tool verification, part characterization, qualification, and environmental testing.

McBain, www.mcbainsystems.com/McBainInfraredInspection_benchtop.php.

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