EE seeks input on EMC and related issues

The EMC+SIPI 2018 Symposium will take place July 30 through August 3 on Long Beach. In recognition of the importance of the topic, the August print issue of EE-Evaluation Engineering will include a staff-written feature article on EMC and related topics. Whether or not you will be participating in the symposium, we want your input so we can communicate your EMC, power-integrity, and signal-integrity strategies to our readers, whether or not they will be in attendance.

Please take a few minutes to send me your responses to one or more of the following questions:

  1. What products or services for EMC test and signal-integrity and power-integrity measurements have you introduced or enhanced over the past year?
  2. Are you presenting a paper at the symposium? If so, please provide the title and a brief description.
  3. If you are exhibiting at the EMC Symposium, what products or services do you plan to highlight?
  4. What trends and challenges are you seeing in EMC test?
  5. How do your products or services help your customers solve EMC, signal-integrity, or power-integrity challenges?

Please send me your comments at [email protected]. Thanks for your help.

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

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