Copper Mountain Technologies announces strategic relationship with National Instruments

July 17, 2019

National Instruments will release Copper Mountain Technologies' PXIe-S5090 9 GHz 2-Port VNA in August.

Indianapolis, IN-based Copper Mountain Technologies (CMT)—a developer of USB and PXI VNA solutions—announced July 17 a strategic relationship with electronic automated test & measurement solutions provider National Instruments.CMT said that the collaboration will bring world-class VNA performance and speed to NI's PXI solution, while NI is set to release the CMT PXIe-S5090 9 GHz 2-Port VNA in August. NI will be the exclusive channel for purchasing CMT's PXI

compatible VNAs. This solution brings NI’s users access to a metrology-grade VNA and allows CMT to expand the solutions it provides for manufacturing and production.

“These are very advanced VNAs in their functionality, performance, and feature set,” CMT co-founder Alex Goloschokin said in a press release. “The VNA has a very fast sweep speed, which is especially important for the production environment.”

Customers were able to see the CMT PXIe-S5090 9 GHz 2-Port VNA at NIWeek during late May and then IMS 2019 during early June.

“The software experience is engineered for short time to first measurement and also for high performance automation with short test times, both key requirements for test engineers bringing VNAs into production test environments,” explained Jason White, NI's director of product planning.

CMT said that with this strategic relationship, the company will expand its solutions to the semiconductor, automotive, aerospace/defense, and education industries moving forward.

About the Author

Mike Hockett | Former Editor

Mike Hockett was Editor in Chief for EE from September 2018 to Sept. 2019. Previously he served as editor for two manufacturing trade publications: Industrial Distribution, and Industrial Maintenance & Plant Operation. He began in sports writing for a trio of newspapers in Wisconsin and Iowa and earned a BA degree in print journalism from UW-Eau Claire.