Evaluating the switching performance of power semiconductors can at times be challenging. That's why power electronics engineers will often turn to double-pulse testing—a powerful tool that executes comprehensive and accurate measurements of advanced transistor designs.
Gregor Hofferbert of Teledyne Lecroy explains a double-pulse testing solution using devices that include DL-ISO optically isolated probes, a T3AFG500 function/arbitrary waveform generator, and a WavePro HD Oscilloscope.
Offering gallium-nitride (GaN) and silicon-carbide (SiC) device characterization with high accuracy, signal fidelity, and connectivity, DL-ISO optically isolated probes have coaxial attenuating tips that reject unwanted noise. They attach to test boards via MMCX connectors or high-voltage-safe square pin headers.
The T3AFG series of dual-channel function/arbitrary waveform generators offers up to 60-MHz maximum bandwidth and a 150-Msample/s rate with 14-bit vertical resolution, providing users with a variety of high fidelity and low-jitter signals.
These are leveraged by the WavePro HD High-Definition oscilloscope, using the company's HD4096 technology for 12-bit resolution at up to 8-GHz bandwidth, with low noise and optimal signal fidelity. Features include up to 5 Gpoints of responsive acquisition memory for a better look at system behavior, and an analysis toolbox to enable deeper insight.
