April 2019

Evaluation Engineering's April 2019 print issue features Special Reports on the topics of Power Semiconductor Test, and High-End Oscilloscopes, both covering market trends, vendor challenges, and new products/solutions. Check out a profile feature on fast-growing PCB prototype-maker Tempo Automation and how it's helping suppliers bring products to market faster than ever, as well as a featured article from Vitrek about the basics of electrical safety test.
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Contributed blogs

April Editorial: Test engineering facing issues of “brain drain,” talent gap

April 1, 2019
EE Editor-in-Chief Mike Hockett discusses electronic test engineering's ongoing battle against veteran engineers retiring and being replaced with inexperienced talent, along with...
Rohde Copy
Products and Solutions

April 2019 Featured Tech

March 28, 2019
Small sub-GHz module Microchip Technology says it has the industry’s smallest IEEE 802.15.4-compliant module that combines an ultra-low-power microcontroller with a sub-GHz radio...
Analog Devices
Products and Solutions

April Tech Focus: Data converters

March 28, 2019
Data converters are the backbone of many test and measurement instruments’ digital transition, and with more and more instruments showing high-definition information on more displays...
Costabrown Tempo 8655
Test & Measurement

The need for PCB assembly speed: Tempo Automation helping bring products to market faster than ever

March 28, 2019
Learn the story of fast-growing PCB prototype supplier Tempo Automation and its role in significantly shrinking the PCBA supply chain timeline.

More content from April 2019

Industrial Safety 1492062a
Embedded

Electrical safety (Hipot) tester functions and application

March 28, 2019
Download this article in .PDF format.Electrical safety testers—often referred to as “hipot” testers—are an integral part of electrical and electronic equipment manufacturing. ...
I Stock 646291934
Test & Measurement

Special Report: Power Semiconductor Test

March 25, 2019
Power semiconductor test vendors discuss trends and challenges in SiC, GaN, IGBT and more
Header Photo
Test & Measurement

April Special Report: High-end oscilloscopes

March 25, 2019
Innovations empower high-end oscilloscopes to serve demanding applications