SpecialReport_SwitchingSystemsFI
Passives

From reed relays to matrices, products adapt to customer needs

June 21, 2018
Switches are seemingly simple and ubiquitous devices, but selecting one—whether a solid-state device, electromechanical relay, or reed relay—can present challenges to an engineer...
SpecialReport_EE201806_5G
Test & Measurement

Scalability, cost, flexibility drive innovation from DC to mmWave

June 21, 2018
Increasingly complex semiconductor devices are adding to the pressure to provide flexible, scalable, and low-cost solutions for semiconductor production. On the test front, companies...
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Test & Measurement

EE – July 2018 Product Picks

June 21, 2018
Direct-reading attenuatorsThis vendor offers full waveguide band high-performance, direct-reading attenuators in the W-, E-, and V-bands. Model STA-60-10-D8 is an instrumentation...
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Test & Measurement

High-frequency 5G wireless infrastructure requires a new approach to PCB manufacturing

June 21, 2018
Much has been written about the impending global rollout of 5G wireless infrastructure, and the profound impact that it will have on everything from mobile phone connectivity ...
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Test & Measurement

LabVIEW 2018 release headlines software-centric NIWeek

June 21, 2018
Austin, TX. NIWeek took place May 21-24 with the host company unleashing new solutions for addressing the challenges emerging from 5G, IoT, and automotive megatrends. Luke Schreier...

More content from July 2018

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Test & Measurement

Key trends driving the need for more semiconductor system-level testing

June 21, 2018
Decades of advances in the semiconductor industry continue to drive an insatiable consumer demand for smaller, more powerful, more ubiquitous semiconductor devices—whether in ...
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Test & Measurement

Nondestructive memory BIST for runtime automotive test

June 21, 2018
Achieving functional safety levels mandated by the ISO 26262 standard requires periodic testing of a vehicle’s electronics. This testing can be applied at three distinct time ...
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Test & Measurement

Flexible, wearable sensors emerge as organizations look to markets

June 21, 2018
Printed, flexible, stretchable (P/F/S), and functional fabric (FF) sensors offer significant opportunities for IoT and wearable applications. For example, A new wearable designed...
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Test & Measurement

Wi-Fi testing and its importance on performance

June 21, 2018
Wi-Fi is continuing its march into the center of connectivity for all things Internet and broadband, and service providers are starting to feel the pain points of wireless connectivity...
Teledyne LeCroy Chipset
Test & Measurement

Data-conversion options span monolithic ICs to modules and boards

June 21, 2018
Data converters are at the heart of many products in an increasingly digitalized world—test instruments as an example. Teledyne LeCroy’s new WavePro HD high-definition oscilloscopes...
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Test & Measurement

Semiconductor design and equipment ecosystems seek alignment

June 21, 2018
This issue’s cover story reports on semiconductor equipment, with a focus on test. But the equipment would remain idle without input from the electronic-design-automation ecosystem...
EE-IndustryUpdateArt
Test & Measurement

Industry Update-July, 2018

June 21, 2018
Warp speed ahead for data processing?Chemists at the University of Waterloo say that they may have discovered a faster and more efficient way to store and process information ...