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    • Kits Target Developing Electronic Engineers
    Embedded

    Maker Kits Focus on Up-and-Coming Electronic Engineers

    A family of Arduino-based kits and projects from Funduino is helping budding electronic engineers learn the ropes.
    Hannover Maker Faire Involves and Expands the Design Community
    Industrial

    Hannover Maker Faire Expands the Design Community

    The Hannover Maker Faire provided manufacturers, educational institutions, and electronics firms a venue to present themselves and their projects to the young and upcoming development...
    Tony Vitolo/Electronic Design
    promo1920x1080
    Embedded

    A Sampling of Resources for the Maker Community

    A wide array of kits and tools are available for Makers and others interested in tinkering and creating electronic systems.
    Yokogawa
    Yokogawa Test & Measurement Releases DLM3000HD Series High-Definition Oscilloscopes and IS8002CDV Classic Data Viewer software
    Test & Measurement

    Advanced Viewing Software Supports High-Def Oscilloscopes

    Yokogawa Test & Measurement released the DLM3000HD Series of high-definition oscilloscopes with IS8002CDV Classic Data Viewer software.
    Power Evaluation and Analysis Solutions Address Advanced Circuit Designs
    Test & Measurement

    Power-Analysis Solutions Test Advanced Components

    MinDCet’s measurement systems analyze losses in inductors and capacitors under real-life operating conditions.
    Three-Phase Integrated GaN IPM Enables Quiet operation, Very Low Dead Time
    Embedded

    "Quiet" Three-Phase GaN IPM Has Very Low Dead Time

    TI’s 650-V, 205-mΩ integrated GaN intelligent power module offers system protection and current sensing.
    Performing Advanced Semiconductor Analysis with Double-Pulse Testing
    Test & Measurement

    Perform Advanced Semi Analysis with Double-Pulse Testing

    Evaluating the switching performance of power semiconductors can be challenging, and double-pulse testing is a powerful tool to take it on.
    Dreamstime_studioclever_322802631
    Test & Measurement

    RPC-Based Platform Accelerates Data Transfer from Test Instruments

    A new remote procedure call (RPC)-based solution dubbed TekHSI enables faster data transfer from test instruments to a user’s PC.
    321753871 © warunporn thangthongtip | Dreamstime.com
    Inside Electronics

    AI Shows Us How History Doesn’t Repeat Itself

    Although artificial intelligence is a significant technology advance, it also serves as a reminder of how technology disruption has impacted society in the past.